Moiré Microscope
Moiré Microscope
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Described is a Moiré microscope proposed in 1996 by Steve Hines that helps identify the geometric structure of materials. For example, a fly’s eye, crystal growth, half-tone printing screens, perforated metal filters, image-coherent fiber-optic bundles, CCD and CMOS image sensors, nano-particles, and the honeycomb lattices of graphene. This device optically super-imposes the image of the test sample onto a reference pattern, and rotates the reference pattern with respect to the image of the sample to create a Moiré interference pattern. It becomes quite clear whether the sample has a hexagonal, square-packed or parallel-line structure.
The sample being examined is laid on the base of the microscope which provides both front and back lighting. A lens relays the image of the sample to the test patterns in the rotatable turret. Each test pattern in the turret can be turned, and the relay lens can be zoomed to find the best match. It is obvious when the correct pattern is compared to the image of the sample at a matching magnification.
Moiré patterns are never sharp images, but rather varying phase relationships between two patterns. The strength of the Moiré microscope is not to provide sharp images or measure samples, but as a field instrument to quickly categorize the geometric structure for further examination using other techniques.
Hines’ lab notebook #1, p. 81:
HinesLab is actively seeking licensees to commercialize this technology. This is not a product being offered for sale to end users. To discuss licensing, please contact Steve Hines at: